Lynx-1024-GigE

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Lynx-1024-GigE

High resolution, high speed uncooled SWIR line-scan camera

Smallest SWIR GigE Vision line-scan camera with excellent sensitivity

Machine vision inspection using Lynx-1024-GigE provides you high resolution information about quality assurance measurements. The SWIR camera matches perfectly the absorption spectra of low-level photon emissions,is less sensitive to emissivity changes for thermal measurements and provides increased subsurface penetration depth images.

The Lynx-1024-GigE offers in many ways an affordable solution. The small form factor, high resolution and smallest pixel pitch of 12.5 μm allows more precision and optimization of compact systems with lower cost lenses.

The Lynx-1024-GigE is also a flexible solution with an industry-standard GigE Vision and Power over Ethernet interface. Furthermore you can change integration times from 1 μs to 1 s.

You will reach optimal image quality choosing from various configurations in High Sensitivity mode (HS) or High Dynamic Range Mode (HDR) and multiple gain settings.

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Benefits & features

  • Made in Europe
    Easy to export - no ITAR
  • Smallest SWIR line-scan camera with smallest pixel pitch
    SWIR linescan camera with up to 2048 pixels and pixel pitch of 12.5um
  • Full flexibility in integration time settings
    Integration time can be set in steps of 1 us
  • Standard GigE Vision and trigger functionality
    GigE Vision standard available for machine vision applications - trigger for synchronization
  • Compliant with any software supporting GenICam
    GigE Vision and GenICam compliant for machine vision
  • High resolution and high sensitivity for low-light conditions
    Low noise detector for high sensitivity under low photon flux conditions
  • Easy exchangeable lenses via C-Mount
    Our cameras are equipped with the standard C-mount lens interface

Designed for use in

  • Food inspection
    Bruises on food can be detected due to the higher moisture contect which will appear darker in the SWIR images
  • Non-destructive testing
    Optical flash thermography, where the sample surface is heated by a brief pulse of heat/light. Mainly used for composites in aerospace industries
  • Industrial web inspection
    Inspection of objects with large surface area using a linescan SWIR camera
  • Semiconductor inspection
    SWIR cameras are able to see through silicon
  • High speed line-scan imaging
    Linerate up to to 40kHz (selected models)
  • Non-contact thermal imaging of (hot) objects
    Detect objects based on their thermal radiation. No contact is needed

Features

IR camera software included

Xeneth camera control and imaging software is included

Power over Ethernet (PoE)

The Gigabit Ethernet interface allows for Power over Ethernet (PoE) connectivity

GigE Vision standard compatibility

The Gigabit Ethernet interface is compatible to the GigE Vision standard

SWaP (Small size, weight and power )

Small volume, low weight and low power consumption for demanding applications

Trigger

External trigger for signal synchronization

14 bit image

Digitization: The camera uses a 14 bit ADC

High speed

High line rate imaging at more than 40000 lines per second

High resolution

1024 pixels in 1 line

High dynamic range

High dynamic range mode available

Camera specifications

Array Specifications

Array Specifications Square pixel array Rectangular pixel array
Array type InGaAs
Resolution 1024 x 1
Pixel size 12.5 μm x 12.5 μm 12.5 μm x 250 μm
Spectral band 0.9 μm to 1.7 μm
Peak Quantum Efficiency (QE) 80%
Pixel operability > 99 %
Array length 12.8 mm
Array cooling Uncooled
Dark current 1.5 x 10⁶ e-/s 1.5 x 10⁷ e-/s

Camera Specifications

Camera Specifications Lynx-1024-GigE
Imaging performance
Maximum line rate 40 kHz
Pixel rate 50 MPixels/sec
Exposure time range Full flexibility in settings from 3 μs to several seconds
CDS Correlated Double Sampling
Gain settings Various settings from 30 fF (HS) till 2130 fF (HDR)
Pixel well depth Various settings from 60 Ke- (HS) till 25 Me- (HDR)
Gain From 8 e-/ADU count (HS) till 580 e-/ADU count (HDR)
Dynamic range From 280:1 (HS) till 2600:1 (HDR)
ADC 14 bit
On-board image processing Configurable single Non-Uniformity Correction (NUC) with intelligent bad pixel replacement; user adjustable fixed offset and gain control
Interfaces
Optical interface C-mount (optional filter retaining ring) F-mount (optional)
Camera control Ethernet (TCP/IP): Xeneth API/SDK
Image acquisition Integrate While Read (IWR) / Integrate Then Read (ITR); Snapshot acquisition
Trigger Trigger in and/or out; LVCMOS Trigger in or out; LVCMOS
Operating mode Stand-alone or PC-controlled
Power requirements
Power consumption +/- 4.6 W
Power supply 12 V
Physical characteristics
Ambient operating temperature range -40ºC to 70ºC (industrial components)
Storage temperature range -50ºC to 85ºC (industrial components)
Dimensions (W x H x L mmᵌ) 49 x 49 x 71
Weight camera head < 208 g

Broad range of accessories available

Lens & filter options

Software

  • Xeneth
  • Xeneth SDK (optional)
  • Xeneth Labview SDK (optional)

Documents

Press Releases
Highest resolution uncooled SWIR line-scan camera Lynx-GigE/CL offers up to 2048 Pixels in an ultra-compact housing The uncooled Lynx-GigE and Lynx-CL SWIR line-scan cameras have a very small form factor which allows for an easy integration in any industrial process. (2012)
Application notes
Space developments resulting in industrial camera platforms Xenics, involved in several space projects such as Proba-V, is responsible for the design and development of the short-wave infrared detectors. A novel high resolution InGaAs line-scan camera from Xenics conquers many applications in the near infrared.
Technical documents
T3 Lynx D This file contains all the technical documents for the Lynx camera.

Brochures

Industrial brochure Lynx-1024-GigE

New Xeneth LabVIEW SDK

LabVIEW toolkit for Xenics cameras offers high-level examples as well as low-level VIs, making it easy for programmers to integrate Xenics cameras into their software applications written in LabVIEW

Jan Šíma, Business Development Manager, ELCOM, a.s.