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Versatile SWIR T2SL camera with response up to 2.5 µm

Superior performance for reliable research

The Xeva-2.5-320 is a compact SWIR camera equipped with a T2SL detector array for imaging in the 1.0 to 2.5 µm wavelength range. The camera features a resolution of 320 x 256 pixels with a 30 µm pixel pitch. It outputs 14-bit data and comes in a 100 Hz or 350 Hz version. 

The Xeva-2.5-320 SWIR camera interfaces to PC via standard USB 2.0 and CameraLink. Each camera is delivered with Xeneth software, which offers direct access to various camera settings such as exposure time and operating temperature. 

Through its advanced thermo-mechanical design, the Xeva-2.5-320 SWIR camera achieves excellent performance levels using a TE4-cooled device operating at temperatures down to 203 K. 

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Benefits & features

  • Spectrometer compatible
    These cameras have mounting holes for spectrographs, making them suitable for (hyper)spectral imaging applications
  • CameraLink and triggering for high speed imaging
    CameraLink interface is suitable for high datarates - triggering can be used for synchronisation at high frame rates
  • High Speed SWIR imaging up to 2.5 µm
    The Xeva-2.5-320 allows for high frame rate imaging up to 340 full frames per second - in a reduced window of interest, even higher frame rates are possible
  • Smallest TE4-cooled camera
    The Xeva-2.50-320 is a very small TE4 cooled T2SL camera with low dark current and response up to 2.50 µm
  • Flexible programming in an open architecture
    SDK (Software Developing Kit) available for all cameras - samples available for C++, LabView, Linux…

Designed for use in

  • R&D (SWIR range)
    R&D in the SWIR range (1.0 - 2.5 µm) is relatively unexplored and provides many research opportunities
  • Semiconductor inspection
    SWIR cameras are able to see through silicon
  • Hyperspectral SWIR imaging
    Combination of spectral imaging and 2D imaging. Our SWIR camera are used for hyperspectral SWIR imaging
  • Art inspection
    SWIR photons can penetrate through paint, hence underdrawings can be investigated
  • Laser beam profiling
    Laser beam analysis for infrared lasers up to 2.5µm


Compatible with a variety of framegrabbers

Several compatible frame grabbers for CameraLink interface are available

Various lens and filter options

Various options for lenses and filters are available

IR camera software included

Xeneth camera control and imaging software is included


External trigger for signal synchronization

Windowing mode

Imaging in a reduced window of interest for increased frame rates (for Xeva 2.35)

14 bit image

Digitization: The camera uses a 14 bit ADC

Multi-stage cooling

Thermo-electric or Peltier cooling in 4 stages

High speed

High frame rate imaging at more than 340fps in full frame. Max frame rate of > 10 kHz at 128 x 8 window.

Spectrograph compatible

Mounting holes available for spectrograph mounting

High dynamic range

High dynamic range mode available

Camera specifications

Array Specifications

Array Specifications Xeva-2.5-320
Detector type T2SL
Spectral range 1.0 µm to 2.5 µm
Image format 320 (w) x 256 (h) pixels
Pixel pitch 30 μm
Array size W: 9.6 mm; H: 7.68 mm; D: 12.29 mm or 0.48 in
ROIC noise High gain: 70 electrons; Low gain: 700 electrons
Integration capacitor High gain: 10 fF; Low gain: 210 fF
Full well capacity High gain: 0.17 x 10⁶ electrons; Low gain: 3.5 x 10⁶ electroncs
Array cooling TE4-cooled
Pixel operability > 99 %
Dark current 150 x 10⁶ e-/s/pixel

Camera Specifications

Camera Specifications Xeva-2.5-320 100 Hz Xeva-2.5-320 350 Hz
Lens LWIR 18 mm F/1
Focal length Broad selection of lenses available
Optical interface C-mount
Imaging performance
Maximum frame rate (full frame) 100 Hz 344 Hz
Min region size No Minimum 128 x 8
Integration type Snapshot
Noise High gain: 10 electrons/ADU; HDR: 1000 electrons
Gain High gain: 10 electrons/ADU; HDR: 210 electrons/ADU
Analog-to-Digital (ADC) 14 bits
Command and control USB 2.0
Image acquisition USB 2.0 or CameraLink CameraLink
Trigger TTL levels
Power requirements
Power consumption 7W without cooling; 84 Watt @ maximum cooling
Power supply 24 V
Physical characteristics
Camera cooling Forced convection cooling
Cool-down time Approximately 2 minutes
Ambient operating temperature range 0 to 40 °C
Dimensions (width x height x length) - excluding lens (approximately) 87 x 115 x 109 mm
Weight (excluding lens) +/- 1.8 kg

Broad range of accessories available

Lens & filter options


  • Xeneth
  • Xeneth SDK (optional)
  • Xeneth Labview SDK (optional)


Press Releases
New cooled MWIR & extended SWIR camera At BiOS and Photonics West 2017 Xenics presents its new cooled MWIR camera and extended SWIR camera
Technical documents
Technical document Xeva-2.5-320 This file contains all the technical documents for the Xeva-2.5-320 camera.
Laser beam profiling and infrared cameras In this white paper, we will address the general need for laser beam profile analysis. Further, we will briefly describe laser beam analysis instruments and give an overview of laser applications, in particular for infrared wavelengths.
Carbon nanotubes applications We review of the use and advantages of (single-walled) carbon nanotubes in a variety of applications in this paper.
Application notes
Why Beam Profiling at 1550nm Requires InGaAs Cameras This article (originally from Ophir-Spiricon) describes an beam analysis application in which the use of a phosphor coated CCD camera was unable to effectively profile a 1550nm laser source with challenging optical arrangements.


Versatile SWIR T2SL camera with response up to 2.50 μm

Professional service, knowledge and advice!

Secure in Air appreciates the professional service, knowledge and advice of Xenics in implementing the Gobi camera in our project GeoCampro. Our client was more than satisfied with the results, looking for (thermal) defects in the railways. 

Robert de Nes, Secure in Air