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Xeva-1.7-640 for excellent image quality research

High resolution and cooled Xeva-1.7-640 near infrared InGaAs camera for excellent image quality research.

The Xeva-1.7-640 is a near infrared camera that employs a 640x512 InGaAs FPA. The Xeva-1.7-640 SWIR camera interfaces to a PC via USB 2.0 or CameraLink. The Xeva-1.7-640 is perfectly suited for applications that require high resolution at medium sensitivity operation.

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Xeva-1.7-640: Advanced research in SWIR imaging

Key features

  • InGaAs detector; >99% pixel operability
  • 0.9 to 1.7 µm sensitivity
  • 640 x 512 pixels
  • Framerate: 25Hz or 90Hz
  • USB 2.0 or CameraLink interface
  • Single stage Peltier cooler
  • External trigger output
  • Four gain modes
  • Sub frame windowing capability

Xeva-1.7-640: High quality, high flexibility

The Xeva-1.7-640 near infrared camera is available with standard (up to 1.7 µm) InGaAs detector arrays and comes in various speed versions: 25Hz and 90Hz. It allows you to choose the most suitable detector-camera configuration for your specific application. The infrared camera head interfaces to a PC via standard USB 2.0 or CameraLink. Each camera is delivered with a graphical user interface X-Control, which offers direct access to various infrared camera settings such as exposure time and operating temperature. The camera outputs 14 bit data. The software tools include two-point uniformity correction and bad pixel replacement.

Key Benefits

Accessories

 - Windowing for increased frame rate

 - Superb low dark current

 - Low-noise imaging

 - Flexible and easy-to-use

 - Spectrograph compatible

 - X-control Advanced

 - Xeneth Radiometric 

 - Thermography studio

 - Frame grabbers

 - Lenses

 - Cables

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Flexibility for easy research

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Advanced research in SWIR imaging

Bobcat_SWIR_Camera.jpg

Xeva-1.7-320

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Xeva_17_320_1.jpg

Flexibile SWIR imaging camera up till 2.5 µm

Xeva_25_320_1.jpg

Xeva-1.7-640: Detailed specifications

 Array Specifications

Xeva-1.7-640

 Array type

 InGaAs

 Spectral band

 Standard 0.9 to 1.7 µm

 # Pixels

 640 x 512

 Array operability

 20 µm

 Array cooling

 TE-1 cooled down to 263K

 

 Pixel operability

 > 99%

Gain

 4 gain settings

Camera Specifications

  Xeva-1.7-640

 Lens (Included)

 Focal length

 25 mm f/0,95

 Optical interface

 C-mount

 Imaging Performance

 Frame rate

 25 Hz / 90 Hz
 Window of interest  Smallest window 8 x 128

 Integration type

 Snapshot

 Exposure time range

 1 s up to 100 seconds

 Noise level:

 Low gain

 High gain

 

 7 AD counts

 14 AD counts

 S/N ratio:

 Low gain

 High gain

 

 67 dB

 61 dB

 A to D conversion resolution  14 bit

 Interfaces

 Camera control

 USB 2.0

 Image acquisition

 USB 2.0 / CameraLink

 Trigger

 TTL levels
 Graphical User Interface  X-control Advanced

 Power Requirements

 Power consumption

 < 4 W, cooler: 30 W max

 Power supply

 12 V - 5 A

 Physical Characteristics

 Camera cooling  Forced convection cooling

  Ambient operating  temperature

 0°C to 50°C

 Dimensions

100 x 100 x 100 mm³

 Weight Camera Head

 App. 1.8 kg 
 Weight Power Supply  300 g

 

 Software Specifications

 Xeva-1.7-640

 X-control Advanced

 - Image live view

 - Store digital pictures/movies

 - Image histogram

 - Line profiles, Spot meters, Time profiles

 - Black hot / White hot

 - False color mode with various color patterns

 - Video output format selection: PAL or NTSC

 X-control Radiometric

 - X-control Advanced features

  + Thermography

 Thermography Studio

 - Analysis and report-generating software of

 real- time and static images 

 

Xeva-1.7-640: Applications

The Xeva-1.7-640 is a high-resolution and cooled shortwave infrared camera which guarantees excellent image quality research. The Xeva-1.7-640 is designed to be used in following applications:

Media Library

Application Examples

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Application Movies

 

 

Xeva-1.7-640: Documentation

All additional information about our high-resolution Xeva-1.7-640 thermo-electrically cooled InGaAs camera can be found within the following documentation:

 

Brochures

Scientific Brochure

 

Press Releases

Extended coverage from SWIR into the visible realm

 

Application Notes

Combination of thermal and low-light level images

Art inspection

 

Related links

Electroluminescence analysis rises quality of thin-film solar cells

  

Feel free to contact us for more information.