Close

News & events

Xenics newsflash April 2017

25/04/2017

In our first newsflash issue for the year, we review the events involving Xenics for the year thus far. Expect to obtain information about the following:

  • our participation in BiOS & Photonics West 2017
  • details about the white paper on Adaptive Optics
  • our participation in Automate 2017
  • our participation in SPIE DCS 2017
  • an interview with Raf Vandersmissen: key specs to look for in SWIR detectors
  • details about the white paper on semiconductor inspection applications
     

To never miss out on developments as they happen, be sure to follow us on our social media channels. Happy reading!  

Newflash April 2017

Back to overview

Press corner

Press kit

The press corner contains the most relevant information about Xenics. You can find the latest press releases, product news and technology news. Our pictures and movies are also available for download in the media gallery. More:

About the use of our images

Do you want to get in touch with our press team?

Contact us for press and media enquiries.

Get in touch

Sign up for our press distribution list

New Xeneth LabVIEW SDK

LabVIEW toolkit for Xenics cameras offers high-level examples as well as low-level VIs, making it easy for programmers to integrate Xenics cameras into their software applications written in LabVIEW

Jan Šíma, Business Development Manager, ELCOM, a.s.