In one compact housing, the Xeva-1.7-320 digital camera combines a thermo-electrically cooled InGaAs detector head and the control and communicatio
SWIR spectroscopy is a valuable tool to classify products. SWIR microscopy is typically used to inspect micro-electronic circuits on chip or wafer level.
Laser gated imaging with short integration time allows imaging at long ranges through haze, smoke, fog or dust.
Low-light-level imaging in semiconductor microscopy applications is used for fault localization in microelectronic failure analysis.
High speed imaging is taking pictures at a high frame rate using a short exposure time. We offer the world's fastest SWIR InGaAs camera and versatile MWIR cameras.
Homeland security is mainly focused on critical infrastructure protection. Image fusion is a great technique as it combines SWIR and LWIR images, resulting in the best of both worlds.
Thermography is widely used in applications where contact-thermometry cannot be used to measure temperature.
Adaptive Optics (AO) or wavefront sensing (WFS) is a technique to measure wavefront errors or distortions, and correct the resulting image in real time.
Major industries of the modern world are utilising lasers in a variety of applications. Laser beam profiling is often critical to ensure correct operation of these applications.