Research & Development


  • SWIR or Short-Wave infrared imaging covers the wavelength range from 700 nm to approximately 2500 nm and is suitable for low light applications.

  • SWIR spectroscopy is a valuable tool to classify products. SWIR microscopy is typically used to inspect micro-electronic circuits on chip or wafer level.

  • Laser gated imaging with short integration time allows imaging at long ranges through haze, smoke, fog or dust.

  • Low-light-level imaging in semiconductor microscopy applications is used for fault localization in microelectronic failure analysis.

  • High speed imaging is taking pictures at a high frame rate using a short exposure time. We offer the world's fastest SWIR InGaAs camera and versatile MWIR cameras.

  • Homeland security is mainly focused on critical infrastructure protection. Image fusion is a great technique as it combines SWIR and LWIR images, resulting in the best of both worlds.

  • Thermography is widely used in applications where contact-thermometry cannot be used to measure temperature.

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Application notes
SWIR cameras are suitable for microscopy as they operate with standard glass optics As SWIR cameras can operate with standard glass optics, they can be used with most existing microscopes
Overview of technical improvements which are needed to use an IR line-scan camera for OCT applications Optical coherence tomography (OCT) has evolved to a standard non-invasive examination procedure yielding detail-rich cross-sectional images of living tissue.
Xlin-1.7-3000 for earth observation The Xlin-1.7-3000 detector is specifically designed for earth observation to reveal lots of detailed information on vegetation, clouds, humidity and other atmospheric conditions.


Extreme compact size and low weight

Given the extremely compact size and low weight of the Xenics XS-1.7-320 SWIR camera it was extremely easy to integrate it into our existing optical setup.

University of Strathclyde