XS-1.7-320

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XS-1.7-320

Flexibility for easy research in SWIR imaging

Ultra-compact and plug-and-play XS-1.7-320 simplifies the way you work

In a very compact housing, the XS-1.7-320 digital infrared camera combines an uncooled InGaAs detector head and the control and communication electronics.

The XS-1.7-320 unit is available with standard InGaAs detector arrays working up to 1.7 μm and comes in a 60 Hz and 100 Hz speed version. It allows you to choose the most suitable detector camera configuration for your specific research application.

The camera head interfaces to a PC via standard USB 2.0. Each camera is delivered with a graphical user interface, which offers direct access to various camera settings such as exposure time and gain setting. The camera outputs 14-bit data. The software tools include two-point uniformity correction and bad pixel replacement.

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Benefits & features

  • USB 2.0 interface
    Plug and plug digital data and command interface on every pc and laptop
  • Stand alone operation
    Camera can be connected to a screen directly (via analog out), no need for a PC to control the camera
  • Performance optimization
    Easy and continuous access to control parameters such as integration time and frame rate
  • TrueNUC image correction
    Image correction valid for a range of integration times
  • Triggering for synchronised operation
    Trigger interface can be used to synchronize the camera to a laser source, or to control the frame acquisition
  • Extending SWIR imaging to the visible
    VISNIR or visible enhanced InGaAs sensors for extended response from 500 to 1700 nm
  • High image quality with compact camera
    320x256 SWIR image with high sensitivity and high dynamic range modes
  • Flexible programming in an open architecture
    SDK (Software Developing Kit) available for all cameras - samples available for C++, LabView, Linux…

Designed for use in

  • R&D (SWIR range)
    SWIR range is a relatively unexplored range and hence providing much research opportunities
  • Solar cell inspection
    Inspection techniques for crack inspection or efficiency mapping based on electroluminescence or photoluminescence
  • Laser beam profiling
    Laser beam analysis for infrared lasers at, e.g., 1064, 1300 and 1550 nm
  • Hyperspectral imaging
    Combination of spectral imaging and 2D imaging. Our SWIR camera are used for hyperspectral SWIR imaging
  • Thermal imaging of hot objects (in the 200°C to 800°C range)
    SWIR cameras can be used for thermal imaging and thermography of high temperature objects (glass, metal…)

Features

IR camera software included

Xeneth camera control and imaging software is included

Stand alone operation

The camera can run autonomously without the need for PC control

SWaP (Small size, weight and power )

Small volume, low weight and low power consumption for demanding applications

Trigger

External trigger for signal synchronization

14 bit image

Digitization: The camera uses a 14 bit ADC

TrueNUC image correction

Non uniformity correction for a wide range of integration times 

High dynamic range

High dynamic range mode available

Camera specifications

Array Specifications

Array Specifications XS-1.7-320
Array type InGaAs
Spectral band 0.9 μm to 1.7 μm (VisNIR optional 0.4 to 1.7 μm)
Resolution 320 x 256
Pixel pitch 30 μm
Array cooling Uncooled
Pixel operability > 99 %

Camera Specifications

Camera Specifications XS Base XS Analog XS Trigger
Lens
Focal length 16 mm f/1.4
Optical interface C-mount
Imaging performance
Maximum frame rate (full frame) 60 Hz 100 Hz
Integration type Snapshot
Integration time range 1 μs - 20 ms
Noise level: Low gain 4 AD counts
Noise level: High gain 15 AD counts
S/N ratio: Low gain 69 dB
S/N ratio: High gain 60 dB
ADC 14 bit
Interfaces
Camera control USB 2.0
Image acquisition USB 2.0
Trigger - TTL levels
Graphical User Interface (GUI) Xeneth Basic Xeneth Advanced
Power requirements
Power consumption 4 W
Power supply 12 V
Physical characteristics
Camera cooling Uncooled
Ambient operating temperature range 0°C to 50°C
Dimensions (W x H x L mmᵌ) 50 x 50 x 50
Weight camera head 225 g

Broad range of accessories available

Lens & filter options

Software

  • Xeneth
  • Xeneth SDK (optional)
  • Xeneth Labview SDK (optional)

Media

Documents

Press Releases
VisNIR option available on our Xeva and XS InGaAs cameras Extending the image capture range of our Xeva and XS into the visible realm, covering a total wavelength area of 0,4 to 1.7 μm (2007)
Application notes
Imaging of guided and scattered light from PICs In order to characterise compact planar optical devices it is necessary to couple light from off-chip sources, and to laboratory based measurement equipment, using standard optical fibre technology. Given the small waveguide cross-sectional area it is often difficult to align both input and output fibres to the PIC using only a top, visible microscope image as a positional guide. This alignment can be significantly accelerated using a SWIR video-rate camera. In the experiments the Xenics XS-1.7-320 InGaAs camera is used.

Brochures

Scientific brochure XS-1.7-320

Extreme compact size and low weight

Given the extremely compact size and low weight of the Xenics XS-1.7-320 SWIR camera it was extremely easy to integrate it into our existing optical setup.

University of Strathclyde