Thermal imaging can be a very powerful tool for semiconductor failure analysis. Current leakage defects typically generate thermal hot-spots: metal short circuits, latch-up, junction defects in diodes and transistors, breakdown of MOS gate oxide, ESD failures, etc. When using conventional thermography or thermal imaging on...


Category:
Tags: , ,

Copper indium gallium (di)selenide (CIGS) thin-film cells for solar energy generation offer decisive economical advantages by enabling the manufacture of lightweight and flexible modules. The development of thin-film solar cell can be accelerated by performing electroluminescence analysis. Analyzing CIGS cells’ inherent near-infrared electroluminescent radiation with sensitive...


Category:
Tags: , , ,