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Application ArticlesMachine Vision

Yield improvement with SWIR cameras

By May 2, 2021August 18th, 2021No Comments

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Abstract

In semiconductor chip manufacturing, an examination of failed components during operation yields valuable information about the production sites process stability and the success of quality assurance measures. The spectrum of low-level photon emissions produced by defects matches exactly the most sensitive realm of SWIR cameras fitted with thermoelectrically cooled InGaAs or HgCdTe area sensors. Such sensors are therefore well suited for failure analysis and quality assurance tasks in semiconductor manufacturing.

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About Xenics

Xenics is a pioneer of infrared technology with a proven track record of twenty years. Xenics designs and markets infrared imagers, cores and cameras of best-in-class image quality to support machine vision, scientific & advanced research, transportation, process monitoring, safety & security and medical applications. Xenics offers a complete portfolio of line-scan and area-scan products for the vSWIR, SWIR and LWIR ranges. Mastering all critical steps of the manufacturing process with advanced production facilities and in-house know-how on detectors, systems and software development Xenics delivers state-of-the-art solutions and optimized custom designs. Xenics ensures its commitment of doing good to the world by developing solutions for enhancing quality of life and sustainability. As a European vendor with a worldwide sales and service network, Xenics supports its customers with simplified export procedures. More at: https://www.xenics.com/ .